News
Examples of Test Devices Equipment Supplied to Customers Worldwide
June 1, 2014
Test Devices upgraded a LCF rig at India’s GTRE.
Advancing Aerodynamic Pulse Generation
June 1, 2014
Test Devices has two distinct methods for exciting resonance frequencies of blades during rotation (Dynamic Spin Testing). These methods are Liquid Jet excitation and Aerodynamic Pulse Generation (APG).
Expertise: Nikhil Kaushal Engineering Manager
June 1, 2014
Nikhil joined Test Devices in 2009 as a Design Engineer.
MFPT Recognizes Endo’s Valve Research
June 1, 2014
The Society for Machinery Failure Prevention Technology (MFPT) published Hiro Endo and Tim Chapman’s latest paper titled “An application of Minimum Entropy Deconvolution Technique in Valve Response Speed Measurement” last year, and COMADEM’s International Journal of Condition Monitoring will also publish it in a special July issue.
Crack Detection: Life Testing Without Inspections or Risks
October 1, 2013
Low Cycle Fatigue (LCF) testing is a common method of spin testing used to evaluate the fatigue performance of life-limited components such as engine rotors.
President’s Message – October 1, 2013
October 1, 2013
As we enter the fourth quarter of 2013, our thoughts naturally turn to our strategic direction. Test Devices will be focusing on four key initiatives between now and the year 2020 that will make us a healthier, more competitive and more profitable company.
Examples Of Our Equipment Supplied Worldwide
October 1, 2013
China’s Aviation Industry Corporation (AVIC), Shenyang Aeroengine Research Institute (606) and The Aeronautical Systems Research Division (ASRD) of Taiwan’s Chung-Shan Institute of Science and Technology (CSIST).
Structured for Success: Test Engineering
October 1, 2013
The execution of a well-planned and well-designed test program is one of the most important and valuable advantages that a test facility like Test Devices provides.
Expertise: Bob Wetherbee, Vice President of Test Engineering
October 1, 2013
Bob Wetherbee joined Test Devices in 2004 with a Mechanical Engineering B.S. from Boston University and experience in the semiconductor and steel industries. He began his time at Test Devices as a Design Engineer, and has held a variety of roles with expanding responsibility and increased technical depth.
Test Devices Discusses Advancement in Elevated Temperature Spin Testing
August 1, 2013
Ever more accelerating trend in pursuing more efficient gas turbines drives the running condition of the engines to hotter and more arduous. This drives the need for new materials, coatings and the associated modeling and testing techniques required to evaluate these in high temperature environments and complex stress conditions. This paper will present the recent […]