News

President’s Message

June 1, 2014

For those of us on the Northeast Coast of the United States summer has finally arrived after a long, cold, snowy winter. Please accept our best wishes for a safe and enjoyable summer!

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Examples of Test Devices Equipment Supplied to Customers Worldwide

June 1, 2014

Test Devices upgraded a LCF rig at India’s GTRE.

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Advancing Aerodynamic Pulse Generation

June 1, 2014

Test Devices has two distinct methods for exciting resonance frequencies of blades during rotation (Dynamic Spin Testing). These methods are Liquid Jet excitation and Aerodynamic Pulse Generation (APG).

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Expertise: Nikhil Kaushal Engineering Manager

June 1, 2014

Nikhil joined Test Devices in 2009 as a Design Engineer.

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MFPT Recognizes Endo’s Valve Research

June 1, 2014

The Society for Machinery Failure Prevention Technology (MFPT) published Hiro Endo and Tim Chapman’s latest paper titled “An application of Minimum Entropy Deconvolution Technique in Valve Response Speed Measurement” last year, and COMADEM’s International Journal of Condition Monitoring will also publish it in a special July issue.

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Crack Detection: Life Testing Without Inspections or Risks

October 1, 2013

Low Cycle Fatigue (LCF) testing is a common method of spin testing used to evaluate the fatigue performance of life-limited components such as engine rotors.

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President’s Message

October 1, 2013

As we enter the fourth quarter of 2013, our thoughts naturally turn to our strategic direction. Test Devices will be focusing on four key initiatives between now and the year 2020 that will make us a healthier, more competitive and more profitable company.

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Examples Of Our Equipment Supplied Worldwide

October 1, 2013

China’s Aviation Industry Corporation (AVIC), Shenyang Aeroengine Research Institute (606) and The Aeronautical Systems Research Division (ASRD) of Taiwan’s Chung-Shan Institute of Science and Technology (CSIST).

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Structured for Success: Test Engineering

October 1, 2013

The execution of a well-planned and well-designed test program is one of the most important and valuable advantages that a test facility like Test Devices provides.

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Expertise: Bob Wetherbee, Vice President of Test Engineering

October 1, 2013

Bob Wetherbee joined Test Devices in 2004 with a Mechanical Engineering B.S. from Boston University and experience in the semiconductor and steel industries. He began his time at Test Devices as a Design Engineer, and has held a variety of roles with expanding responsibility and increased technical depth.

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