Bob Wetherbee joined Test Devices in 2004 as a Design Engineer. With a Mechanical Engineering B.S. from Boston University and experience in the semiconductor and steel industries, he has demonstrated expertise in all aspects of spin testing, including tooling design, analysis, static hardware design (environmental chambers and excitation hardware for blade resonance testing) and the development of new testing methods and required hardware. Wetherbee’s professionalism and attention to detail are evident in the successful execution of complex tests, especially rotating blade excitation (HCF) in TDI’s unique Dynamic Spin Rig (DSR®). Wetherbee is currently Test Engineering Manager for Test Devices.