April 2012 Newsletter

New Frontiers in Spin Testing

April 1, 2012

Recent R&D efforts in advanced spin testing paid off when customers presented unique challenges to the Test Devices team.

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Dear Test Devices Customers and Friends

April 1, 2012

As I contemplated the introduction to our first ever Newsletter I found myself with a severe case of writer’s block. The significant changes we have experienced over my short five year tenure as President left me wondering about where to begin.

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Elevated HCF Testing

April 1, 2012

Test Devices recently demonstrated its unique Aerodynamic Pulse Generation (APG) technique to perform high-cycle fatigue (HCF) tests in elevated temperature conditions. This allows a more realistic way for OEMs to evaluate the durability and behavior of the rotating airfoils.

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Testing in a Dynamic Spin® Rig Provides In-Depth Analysis

April 1, 2012

Gas turbine engineers are under pressure to develop higher performance, fuel-efficient engines and create new ways to test components that will run in hotter, harsher gas turbine engine environments. To evaluate the performance of materials, coatings and parts that will operate in the new generation of high performance engines, the engineers at Test Devices are developing equipment and testing methodologies that can simulate more engine-like conditions.

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Expertise: Hiro Endo, Vice President of Engineering, Test Devices

April 1, 2012

Hiro Endo was born in Tokyo and spent his early childhood in Africa and in the Philippines. His High School and University studies were in Australia, where he earned his Ph.D. in mechanical engineering from the University of New South Wales in Sydney.

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Company Doubles HCF Testing Capabilities

April 1, 2012

To help meet the increasing need for vibro-dynamics testing of bladed rotors, Test Devices has doubled its capacity to conduct high-cycle fatigue (HCF) testing.

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Russia, China Buy $17M in Test Equipment

April 1, 2012

Two leading turbine research institutions have purchased nearly $17M in jet engine test equipment from Test Devices.

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