News
The Next Generation in Component Test Capability
09.02.2008
Test Devices will be presenting at the 2nd Joint EVI-GTI / PIWG INTERNATIONAL GAS TURBINE INSTRUMENTATION CONFERENCE in Seville, Spain, September 24-26 2008. At the conference TDI will be highlighting its dynamic testing capability in a technical presentation entitled “Dynamic Spin Rigs – The Next Generation in Component Test Capability”on Friday, September 26th at 10:30 AM. Please attend to hear the latest about this valuable technology.
Test Devices is the leader in providing spin testing services and equipment that produce more relevant data under realistic engine conditions. Our unique technologies include:
• Thermo-mechanical fatigue (TMF) spin testing
• Dynamic blade excitation (HCF), long resonance dwelling, realistic temperatures
• Validation of Goodman Diagrams (dynamic/static stress interaction)
• Detection of cracks in rotating assemblies during LCF testing
• Measurement of elastic and plastic component growth at speed
• Thermal Gradient Testing (combined radial & axial)
• Dynamic Spin Rigs
For additional information about the conference visit http://www.evi-gti.com.